教师名录

冯晓冰 助理教授

所在系所制造技术与装备自动化研究所
办公电话34206081
通讯地址机械与动力工程学院A楼728室
电子邮件xiaobing.feng@sjtu.edu.cn
个人主页

  • 教育背景

    2008.8 - 2014.1 新加坡国立大学 机械工程学院 博士
    2004.9 - 2008.7 上海交通大学 机械工程及自动化专业 学士
  • 工作经历

    2018.12 - 迄今 上海交通大学 机械与动力工程学院 制造技术与装备自动化所 助理教授
    2014.4 - 2018.11 英国诺丁汉大学 (University of Nottingham) 精密测量专业 博士后
  • 出访及挂职经历

    2014.4 - 2018.11 英国诺丁汉大学 (University of Nottingham) 精密测量专业 博士后
  • 研究方向

    数控机床原位测量
    超精密三坐标测量仪探针无损清洁
    精密测量仪器性能标定(ISO 10360, VDI/VDE 2634, ISO 25178)
    表面形貌测量及表面特征分析
    几何形状及尺寸测量
    卷对卷加工在线测量
    数控机床误差测量、建模与补偿研究
    精密检测与加工
  • 科研项目

    2018.3 - 2018.11 欧洲iNet项目,"基于机器人与结构光的三维光学形貌测量系统的性能评估与标定",主研
    2017.3 - 2017.8 横向课题,"新型点自动聚焦扫描测量仪的性能评估与标定",第二负责人
    2017.1 - 2018.11 欧洲测量协会项目,15HLT09,"增材制造医疗植入物检测与测量"子课题,"脊椎矫正手术定制植入物及手术辅助工具",主研
    2016.7 - 2018.5 欧洲测量协会项目,14IND09,"高度并行制造工艺的检测与测量"子课题,"卷对卷高速在线缺陷检测技术",主研
    2016.5 - 2016.12 横向课题,"复杂表面的精密测量与分析",主研
    2014.4 - 2016.5 欧洲测量协会项目,IND59,"多传感器测量创新工业产品中的微部件"子课题,"超精密三坐标测量机微探针的精密清洁",主研
  • 代表性论文专著

    期刊论文
    2018
    [1] Feng X#, Su R#*, Happonen T, Liu J, Leach R K 2018 Fast and cost-effective in-process defect inspection for printed electronics based on coherent optical processing Opt. Express 26 13927-13937
    [2] Maculotti G, Feng X*, Galetto M, Leach R K 2018 Noise evaluation of a point autofocus surface topography measuring instrument Meas. Sci. Technol.29 065008
    [3] Cheung C F, Liu M, Leach R K, Feng X, Zhao C 2018 Hierarchical-information-based characterization of multiscale structured surfaces Ann. CIRP 67 539-542
    [4] Wu J, Bin D, Feng X, Wen Z, Zhang Y 2018 GA based adaptive singularity-robust path planning of space robot for on-orbit detection Complexity 2018 3702916
    [5] Liu M Y, Cheung C F, Feng X, Wan C J, Leach R K 2018 A self-calibration rotational stitching method for precision measurement of revolving surfaces Prec. Eng. 54 60-69

    2017
    [1] Feng X#, Pascal J, Lawes S* 2017 A microscopy approach for in situ inspection of the μCMM stylus for contamination Meas. Sci. Technol. 28 095010
    [2] Feng X#, Kinnell P K, Lawes S* 2017 Development of CO2 snow cleaning for in situ cleaning of μCMM stylus tips Meas. Sci. Technol. 28 015007
    [3] Shi S, Lin J, Xu X, Feng X, Piano S 2017 Manufacturing-error-based maintenance for high-precision machine tools Int. J. Adv. Manufac. Technol. 95 205-217

    2016
    [1] Feng X#, Wong Y S*, Hong G S 2016 Characterization and geometric modeling of single and overlapping craters in micro-EDM Mach. Sci. Technol. 20 79-98

    工业杂志论文
    [1] Leach R K, Senin N, Feng X, Stavroulakis P, Su R, Syam W P, Widjanarko T 2017 Information-rich metrology: changing the game Commercial Micro Manufacturing 8 33-39
    [2] Lawes S, Feng X 2016 In-situ cleaning of μCMM stylus using CO2 snow Commercial Micro
    Manufacturing 2 28-31

    会议论文
    [1] Feng X, Su R, Happonen T, Liu J, Leach RK 2018 All-optical difference engine for in-process defect inspection for roll-to-roll printed electronics 10th ISPEMI, Kunming, China Aug
    [2] Echeta I, Feng X, Piano S, Leach R K 2018 Analysis of strut bending defects in additively manufactured lattice structures by X-ray computed tomography dXCT, Nottingham, UK, Jul
    [3] Maculotti G, Feng X, Galetto M, Leach R K 2018 Measurement noise calibration, noise bandwidth specification and environment effects in a 3D point autofocusing instrument Proc. 18th Int. euspen Conf., Venice, Italy, Jun 155-156
    [4] Feng X, Quagliotti D, Maculotti G, Syam W S, Tosello G, Hansen H N, Galetto M, Leach R K 2017 Measurement noise of a point autofocus surface topography instrument Proc. 16th Met. & Props, Gothenburg, Sweden, Jun 66-67
    [5] Feng X, Su R, Liu M, Leach R K 2017 Optical difference engine for defect inspection in highly-parallel manufacturing processes 12th LAMDAMAP Conf., Wotton-under-Edge, UK, Mar 214-217
    [6] Feng X, Lacorne C, Fernandes G Q, Lawes S, Kinnell P 2015 Contamination of µCMM stylus tips: on-machine inspection Proc. 16th Int. euspen Conf., Nottingham, UK, Jun 85-86
    [7] Feng X, Lawes S, Kinnell P 2015 The development of a snow cleaning system for micro-CMM stylus tips Proc. 15th Int. euspen Conf., Leuven, Belgium, Jun 191-192
    [8] Feng X, Lawes S, Kinnell P 2015 Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips Proc. 4M/ICOMM 2015 Conf., Milan, Italy, Mar 506-509
    [9] Feng X, Wong Y S, Hong G S 2014 Characterization and modeling of single and overlapping crater shapes in micro-EDM 11th Asia Pac. Conf. Mater. Proc. Auckland, New Zealand, Jul
    [10] Feng X, Wong Y S, Hong G S 2012 Modeling of Micro Wire EDM Process and Wire Vibration ICOMM 2012 Evanston, Illinois, USA, Mar
  • 学术兼职

    欧洲精密工程和纳米技术协会(euspen)会员
    Machining Science and Technology期刊评审
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